An Overview of X-Ray Analysis Technology

An Overview of X-ray Analysis Technology introduces the basic theoretical knowledge of X-ray physics, X-ray diffraction direction and intensity, polycrystalline X-ray diffraction analysis, etc. Various X-ray techniques commonly used in current scientific research are introduced in the book, including the use of X-ray diffraction technology to analyze the phase, residual stress, grain size, dislocation density, texture, etc. of materials, as well as the use of X-ray photoelectron spectroscopy to analyze the types and contents of surface elements of materials. The book also introduces the three-dimensional X-ray microscopy analysis method developed in recent years based on electronic computed tomography technology. Thee technologies covered introduce basic principles, methods, experimental operations, and case analysis.

• Format: Paperback
• Language: English
• ISBN: 0443493324
• ISBN13: 9780443493324
• Release Date: November 2026
• Publisher: Elsevier
• Length: 300 Pages