An Improved Markov Random Field Design Approach For Digital Circuits

By Jahanzeb Anwer

As the MOSFET dimensions scale down to nanoscale level, the reliability of circuits based on these devices decreases. Therefore, a mechanism has to be devised that can make the nanoscale systems... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3844332634
• ISBN13: 9783844332636
• Release Date: May 2011
• Publisher: LAP Lambert Academic Publishing
• Length: 88 Pages
• Weight: 0.31 lbs.
• Dimensions: 0.2" x 6.0" x 9.0"