Advances in X-Ray Analysis: Volume 35b

By: Barrett, C.S.

Book Overview

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461365325
• ISBN13: 9781461365327
• Release Date: November 2012
• Publisher: Springer
• Length: 641 Pages
• Weight: 2.24 lbs.
• Dimensions: 1.3" x 6.7" x 9.6"