Advances in X-Ray Analysis, Vol. 20

By Charles S. (editor) Barrett

X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0306381206
• ISBN13: 9780306381201
• Release Date: January 1976
• Publisher: Plenum Press
• Length: 604 Pages
• Weight: 2.70 lbs.