Advanced Scanning Electron Microscopy and X-Ray Microanalysis

by C.E. Fiori, David C. Joy, Dale E. Newbury, et al.

Book Overview

This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide... This description may be from another edition of this product.

• Format: Hardcover
• Language: English
• ISBN: 0306421402
• ISBN13: 9780306421402
• Release Date: March 1986
• Publisher: Springer
• Length: 454 Pages
• Weight: 1.80 lbs.
• Dimensions: 1.1" x 6.3" x 9.3"