Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions

By M. Muralidhar Singh, Ch Sateesh Kumar, Ram Krishna

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.

• Format: Paperback
• Language: English
• ISBN: 1032375116
• ISBN13: 9781032375113
• Release Date: November 2024
• Publisher: CRC Press
• Length: 130 Pages
• Weight: 0.47 lbs.
• Dimensions: 0.3" x 6.1" x 9.2"