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Advanced Materials Characterization: Basic Prin...

By M. Muralidhar Singh, Ch Sateesh Kumar, Ram Krishna

Edition Description

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS-...

Edition Details

Format:Paperback

Language:English

ISBN:1032375116

Format: Paperback

Condition:

65.99

Quantity:

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Advanced Materials Characterization: Basic Prin...

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