Advanced Materials Characterization

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Advanced Materials Characterization: Basic Prin...

By Ram Krishna, Ch Sateesh Kumar, M. Muralidhar Singh

Edition Description

The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS-...

Edition Details

Format:Hardcover

Language:English

ISBN:1032375108

Format: Hardcover

Condition:

165.00

Quantity:

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Advanced Materials Characterization: Basic Prin...

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