Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

By Kamal Youcef-Toumi, Fangzhou Xia, Ivo W. Rangelow

Book Overview

From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3031442350
• ISBN13: 9783031442353
• Release Date: February 2025
• Publisher: Springer
• Length: 366 Pages