Ab Initio Modelling of Scanning Tunneling Spectroscopy and Microscopy

By Alexey Dick

Scanning tunneling microscopy (STM) is one of the most powerful and established state-of-the-art techniques to characterize surface properties at nano-scale. Despite the power of the STM, in most... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3639365534
• ISBN13: 9783639365535
• Release Date: September 2011
• Publisher: VDM Verlag
• Length: 232 Pages
• Weight: 0.76 lbs.
• Dimensions: 0.5" x 6.0" x 9.0"