All Formats & Editions

1 - 1 of 1 results found

Sort by:

2001 6th International Workshop on Statistical ...

Edition Description

The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design;...

Edition Details

Format:Hardcover

Language:English

ISBN:0780366883

Format: Hardcover

Condition:

82.98

Save $45.02!

List Price: ~~$128.00~~

Quantity:

ThriftBooks sells millions of used books at the lowest everyday prices. We personally assess every book's quality and offer rare, out-of-print treasures. We deliver the joy of reading in recyclable packaging with free standard shipping on US orders over $15. ThriftBooks.com. Read more. Spend less.

Copyright © 2026 Thriftbooks.com Terms of Use | Privacy Policy | Do Not Sell/Share My Personal Information | Cookie Notice | Cookie Preferences | Accessibility Statement
ThriftBooks ^® and the ThriftBooks ^® logo are registered trademarks of Thrift Books Global, LLC

All Formats & Editions

2001 6th International Workshop on Statistical ...

Popular Categories

Website

My Account

Partnerships

Quick Help

About Us

Follow Us