2001 6th International Workshop on Statistical Methodology: Iwsm: June 10, 2001/Kyoto

By: IEEE Staff

The proceedings of the 6th International Workshop on Statistical Metrology, held in 2001. The papers cover: yield ramping methodology; metrology for statistical process control; sensor and measurement technology; spatial and temporal variation analysis methods; robust design; and more.

• Format: Hardcover
• Language: English
• ISBN: 0780366883
• ISBN13: 9780780366886
• Release Date: January 2001
• Publisher: IEEE
• Length: 67 Pages