2000 International Conference on Simulation Semiconductor Processes and Devices

By International Conference on Simulation of Semiconductor Processes and and IEEE

The proceedings of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), 2000. Topics include: device simulation; quantum effects and novel devices; process simulation; lithography simulation; user interfaces and visualization; calibration; and more.

• Format: Paperback
• Language: English
• ISBN: 0780362799
• ISBN13: 9780780362796
• Release Date: January 2000
• Publisher: IEEE
• Length: 282 Pages
• Weight: 1.01 lbs.
• Dimensions: 10.8" x 0.8" x 8.3"