17th IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems

By: unknown author

These 45 papers from the November 2002 symposium discuss techniques to assess and enhance the yield, reliability, and availability of VLSI systems. Several of the contributors present new approaches to fault simulation and injection, concurrent error detection, yield prediction, and sequential circu

• Format: Paperback
• Language: English
• ISBN: 0769518311
• ISBN13: 9780769518312
• Release Date: November 2002
• Publisher: IEEE
• Weight: 1.35 lbs.
• Dimensions: 8.5" x 1.0" x 5.8"