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Diebold, Alain
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Optical and Electrical Properties of Nanoscale Materials
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179.99
Format: Paperback
Condition: New
Characterization and Metrology for ULSI Technology: 2003 : 2003 International Conference on Characterization and Metrology for ULSI Technology
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Characterization and Metrology for Ulsi Technology : 1998 International Conference (AIP Conference Proceedings, Vol. 449)
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Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology (AIP Conference Proceedings ... / Materials Physics and Applications)
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Characterization and Metrology for ULSI Technology 2005
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Characterization and Metrology for ULSI Technology 2000 : International Conference
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