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Paperback Model-Based Testing for Embedded Systems Book

ISBN: 1138076457

ISBN13: 9781138076457

Model-Based Testing for Embedded Systems

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Format: Paperback

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Book Overview

What the experts have to say about Model-Based Testing for Embedded Systems:

"This book is exactly what is needed at the exact right time in this fast-growing area. From its beginnings over 10 years ago of deriving tests from UML statecharts, model-based testing has matured into a topic with both breadth and depth. Testing embedded systems is a natural application of MBT, and this book hits the nail exactly on the head. Numerous topics are presented clearly, thoroughly, and concisely in this cutting-edge book. The authors are world-class leading experts in this area and teach us well-used and validated techniques, along with new ideas for solving hard problems.

"It is rare that a book can take recent research advances and present them in a form ready for practical use, but this book accomplishes that and more. I am anxious to recommend this in my consulting and to teach a new class to my students."

--Dr. Jeff Offutt, professor of software engineering, George Mason University, Fairfax, Virginia, USA

"This handbook is the best resource I am aware of on the automated testing of embedded systems. It is thorough, comprehensive, and authoritative. It covers all important technical and scientific aspects but also provides highly interesting insights into the state of practice of model-based testing for embedded systems."

--Dr. Lionel C. Briand, IEEE Fellow, Simula Research Laboratory, Lysaker, Norway, and professor at the University of Oslo, Norway

"As model-based testing is entering the mainstream, such a comprehensive and intelligible book is a must-read for anyone looking for more information about improved testing methods for embedded systems. Illustrated with numerous aspects of these techniques from many contributors, it gives a clear picture of what the state of the art is today."

--Dr. Bruno Legeard, CTO of Smartesting, professor of Software Engineering at the University of Franche-Comt?, Besan?on, France, and co-author of Practical Model-Based Testing

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