X-Ray Diffraction by Disordered Lamellar Structures: Theory and Applications to Microdivided Silicates and Carbons

by Cyril Tchoubar and Victor A. Drits

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 364274804X
• ISBN13: 9783642748042
• Release Date: December 2011
• Publisher: Springer
• Length: 371 Pages
• Weight: 1.21 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"