Modeling of Electrical Overstress in Integrated Circuits

by Sung-Mo Kang, Carlos H. Diaz, Charvaka Duvvury

Book Overview

Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 1461362059
• ISBN13: 9781461362050
• Release Date: September 2012
• Publisher: Springer
• Length: 148 Pages
• Weight: 0.57 lbs.
• Dimensions: 0.4" x 6.1" x 9.2"