In-Situ Microscopy in Materials Research: Leading International Research in Electron and Scanning Probe Microscopies

Book Overview

2. High Temperature UHV-STM System 264 3. Hydrogen Desorption Process on Si (111) Surface 264 4. (7x7) - (1 xl) Phase Transition on Si (111) Surface 271 Step Shifting under dc Electric Fields 275 5. 6. Conclusions 280 Acknowledgements and References 281 12. DYNAMIC OBSERVATION OF VORTICES IN SUPERCONDUCTORS USING ELECTRON WAVES 283 by Akira Tonomura 1. Introduction 283 2. Experimental Method 284 2. 1 Interference Microscopy 284 2. 2 Lorentz Microscopy...

• Format: Paperback
• Language: English
• ISBN: 1461378508
• ISBN13: 9781461378501
• Release Date: February 2014
• Publisher: Springer
• Length: 336 Pages
• Weight: 1.11 lbs.
• Dimensions: 0.8" x 6.1" x 9.2"