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Paperback Applied Scanning Probe Methods XII: Characterization Book

ISBN: 3642098703

ISBN13: 9783642098703

Applied Scanning Probe Methods XII: Characterization

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Book Overview

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where... This description may be from another edition of this product.

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