Applied Scanning Probe Methods XII: Characterization

by Harald Fuchs

Book Overview

Crack initiation and growth are key issues when it comes to the mechanical reliab- ity of microelectronic devices and microelectromechanical systems (MEMS). Es- cially in organic electronics where... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3642098703
• ISBN13: 9783642098703
• Release Date: November 2010
• Publisher: Springer
• Length: 224 Pages