X-Ray Microscopy II: Proceedings of the International Symposium, Brookhaven, Ny, August 31-September 4, 1987

This volume is based on papers presented at the International Symposium on X-Ray Microscopy held at Brookhaven National Laboratory, Upton NY, August 31-September 4, 1987. Previous recent symposia on... This description may be from another edition of this product.

• Format: Paperback
• Language: English
• ISBN: 3662144905
• ISBN13: 9783662144909
• Release Date: October 2013
• Publisher: Springer
• Length: 455 Pages
• Weight: 1.38 lbs.
• Dimensions: 0.9" x 6.0" x 9.0"