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Modeling of Electrical Overstress in Integrated...
Edition Description
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated...
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Format:Hardcover
Language:English
ISBN:0792395050
Format: Hardcover
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Modeling of Electrical Overstress in Integrated...
Edition Description
Electrical overstress (EOS) and Electrostatic discharge (ESD) pose one of the most dominant threats to integrated circuits (ICs). These reliability concerns are becoming more serious with the downward scaling of device feature sizes. Modeling of Electrical Overstress in Integrated...
Edition Details
Format:Paperback
Language:English
ISBN:1461362059
Format: Paperback
Condition:
$
169.99
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