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Hot-Carrier Reliability of Mos VLSI Circuits
Edition Description
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the...
Edition Details
Format:Hardcover
Language:English
ISBN:079239352X
Format: Hardcover
Condition:
$
219.99
50 Available
Hot-Carrier Reliability of Mos VLSI Circuits
Edition Description
As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming an important problem. The assessment and improvement of reliability on the circuit level should be based on both the...
Edition Details
Format:Paperback
Language:English
ISBN:1461364299
Format: Paperback
Condition:
$
219.99
50 Available
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